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Electronic & Semiconductor Failure
Analysis Solutions Limited
LEGO blocks down to the building blocks of the semiconductor industry
Did you ever wonder what goes on inside LEGO's new 'SMART Brick'? Well we did, and we thought it was the ideal opportunity to demonstrate some of our sample preparation and imaging excellence. In particular, a cross-sectioning technique we have decided to call 'Immacuslice-AF'. The AF stands for Artefact-Free, which means what you see in the cross-section is real, and hasn't been introduced by the sample preparation process itself. Below are a few teaser images......

We went to transistor-level on the Smart Brick, while also pairing x-ray CT with our 'Immacuslice-AF' sectioning technique to show how we go from mm-scale to nm-scale in one seamless, pristine workflow.
If you want to read the full report, click below:
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