Electronic & Semiconductor Failure Analysis Solutions Limited
Clarification in Resolution
At ESFAS, we deliver reliable and timely physical analysis services tailored to the specific needs of our clients. Our decades-long expertise ensures exceptional results every time
Preparation is Everything
We pair our novel sample preparation techniques with state-of-the-art imaging to open up a whole new world of visibility
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Whatever the cocktail of materials that are being used in your device, package or product, we can find a way to characterise the process and aid effective process development and new product development
Insights you can Trust
ESFAS are experts in all aspects of the physical analysis of semiconductors and electronics with more than 21 years of experience
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We understand that the data you receive needs to be trusted, accurate and free from induced artefacts
A Commitment to Quality
ESFAS's mission is to provide unmatched services by understanding the full picture
From transistor-level to package and board-level, we have the skills and experience necessary to get to the bottom of your process development and manufacturing challenges
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"If you have the will, we will find the way"
Sectors Served
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Semiconductor
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Electronic
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Pharmaceutical
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Print and Coatings
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Materials Science
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Engineering
Our Areas of Expertise
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Scanning Electron Microscopy
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Energy Dispersive X-Ray
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Transmission Electron Microscopy
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Focused Ion Beam Microscopy
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Mechanical Grinding & Polishing
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Broad Ion Beam Milling & Polishing
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Chemical Deprocessing
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Optical Microscopy
Contact
(+44) 7514 538 213
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Construction Analysis
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Failure Analysis
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Elemental Analysis
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Competitive Analysis
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Process Development
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Lab Build-Out
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Consultancy
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Training
Sample Preparation
We understand the challenges in preparing samples to give the very best results. We select the best techniques depending on the composition of your product.
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Preparation is Everything!
Imaging Techniques
We utilise cutting-edge imaging solutions to visually document failures and anomalies. From optical microscopy down to Transmission Electron Microscopy (TEM), and everything in between.
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Centimetre to Nanometre!